AMP® Vision
Interstella Products > AMP® Vision Technology
AMP® VISION TECHNOLOGY
Adaptive Multi-layer Profiling
Objectives
AMP®, Adaptive Multi-layer Profiling, is a revolutionary technology developed by INTERSTELLA. Traditional system require Z-Axis movement of respective vision module to perform inspection on objects with different height profile. This process is relatively slow and have great impact on UPH Yield.
Concept
AMP® enable user to capture high resolution image through ultra speed variable-focusing and real-time Extended Depth of Field (EDoF) positioning without any adjustment needed on the Z-Axis mechanism.
Vision Capability
Items
Field of View
Chip-Particle Detectability
Under-kill
Overkill
Repeatability
Cycle Time
Description
10.0 x 10.0 mm
≥ 1.0 um
≤ 0.1%
≤ 1.0%
90%
0.55 sec/ea
10.0 x 10.0 mm
≥ 1.0 um
≤ 0.1%
≤ 1.0%
90%
0.55 sec/ea